Loaded Board Test Probe CPM-4

Description

The loaded board test probe is applied for examining the loaded circuit boards. The common testing methods for loaded boards are ICT (In-Circuit Test) and FCT (Function Test). Both methods examine the performance of components and circuit connections to detect the defective components during production. ICT and FCT ensure the loaded circuit boards’ normal operation through assessing connection performance of the testing components at the replicated environment of the future application field and controlling the electrical performance of the components to assess the comprehensive connection of the circuit.

Specification:
1. Recommended min. center: 3.0(.118″)
2. Full travel: 10(0.393″ )
3. Current rating: 8A
4. Contact resistance: 50mΩ

Materials and finishes:
1. Plunger: Brass, Au plated
2. Barrel: Brass, Ni plated
3. Spring: Stainless